New Equipment on Board - Scanning Electron Microscope (SEM)

A new Scanning Electron Microscope (SEM), equipped with Oxford EDX System, is now located at Concrete Materials Laboratory (ZB109). This tungsten thermionic emission SEM system is suitable for low- and high-vacuum operations. A high spatial resolution with secondary electron (SE) and backscatter (BSE) detector allows the observation with fine surface details, whilst the EDX detector provides elemental and chemical analysis. The SEM is designed for comprehensive materials characterization down to nanoscale. This instrument is best suited to imaging and analysis of coated samples that are stable under the electron beam, e.g. concrete, rocks, metals and alloys. 

Specifications / Applications:

• An extra-large analytical chamber with a full 5-axis motorized stage
• Detector: SE, BSE, EDX
• Imaging up to 100,000X
• Accelerating voltage: 200V to 30 kV
• 5 Electron Optics Working Modes: Resolution, Depth, Field, Wide Field, Channeling
• Rotation: 360°continuous / Tilt: -30° to +90°
• IR TV Camera for the “Chamber View”