Fischione’s Model 1040 NanoMill

Introduction:

Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

Applications:

• Ultra-low-energy, inert-gas ion source
• Concentrated ion beam with scanning capabilities
• Removes damaged layers without redeposition
• Ideal for post-focused ion beam processing
• Enhances the results from conventionally prepared specimens
• Room temperature to cryogenically cooled NanoMilling SM process
• Rapid specimen exchange for high- throughput applications
• Computer-controlled, fully programmable, and easy to use
• Contamination-free, dry vacuum system

Notes to users:

Supplier information: 

         https://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill®-tem-specimen-preparation-system

Equipment location:

Room W205