Fourier Transform Infrared Spectrometer
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Specifications
Major Functions / Key Features
- Capable of performing absorption, transmission and reflection measurements of thin films, nanomaterials or liquids (such as optical response of smart materials, photonic materials, metallic nanostructures, semiconductor quantum dots and nanocrystals, graphene, and graphene oxide etc.) in the wavelength range spanning visible (500 nm) to Terahertz regime (1.5 THz or 200 μm)
- Integration of the microscope, this FTIR system enables both ensemble measurements (large-area samples) and selective micro-scale characterizations (interrogation area down to tens of μm2 in the visible and NIR range)
- To perform automatically spatial mapping of optical properties of various samples
Location
DE702aRestriction
Booking via AP Online Booking SystemFee
- Internal PolyU Users: $120/ hr
- UGC-funded Tertiary Institutes: $210/ hr
- Other External Users: $300/ hr
Other Information
Manufacturer: Bruker
Model: VERTEX 70, HYPERION 2000
Category: Materials science
Owned by: Department of Applied Physics
Contacts
Dr Hon Fai Wong
Department of Applied Physics
- 2766 5701
- hf.wong@polyu.edu.hk
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