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Fourier Transform Infrared Spectrometer

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Specifications

Major Functions / Key Features

  • Capable of performing absorption, transmission and reflection measurements of thin films, nanomaterials or liquids (such as optical response of smart materials, photonic materials, metallic nanostructures, semiconductor quantum dots and nanocrystals, graphene, and graphene oxide etc.) in the wavelength range spanning visible (500 nm) to Terahertz regime (1.5 THz or 200 μm) 
  • Integration of the microscope, this FTIR system enables both ensemble measurements (large-area samples) and selective micro-scale characterizations (interrogation area down to tens of μm2 in the visible and NIR range) 
  • To perform automatically spatial mapping of optical properties of various samples 

Location

DE702a 

Restriction

Booking via AP Online Booking System

Fee

  • Internal PolyU Users: $120/ hr 
  • UGC-funded Tertiary Institutes: $210/ hr 
  • Other External Users: $300/ hr 

Other Information

Manufacturer: Bruker

Model: VERTEX 70, HYPERION 2000

Category: Materials science

Owned by: Department of Applied Physics

Contacts

Dr Hon Fai Wong

Department of Applied Physics


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