Atomic Force Microscope (AFM)-based Near-field Scanning Optical Microscope System

Major Functions / Key Features

• AFM tips to bring light from different sources (visible, IR and THz) into focus below the diffraction limit of the light, allowing for highly-localized excitation and probing of samples 
• Together with the optical microscope attached to the system, locating specific features on sample surfaces is possible for selective characterization purposes 
• Capable of mapping optical near-fields in various plasmonic nanostructures 
• Highly desirable for the studies of smart nanomaterials, photonic materials and their novel devices 
• The main features of the NTEGRA Spectra are: 
  
  • Simultaneous AFM and confocal Raman/fluorescence imaging 
  • Microscopy and spectroscopy at the molecular scale 
  • HybriD™ Mode 
  • Investigation of optical properties beyond the diffraction limit