Fischione 1040 Nanomill TEM-FIB Specimen Preparation System

Specifications

Major Functions / Key Features Location Restriction Fee Other Information

Major Functions / Key Features

Ultra-low-energy, inert-gas ion source
Concentrated ion beam with scanning capabilities
Removes damaged layers without redeposition
Ideal for post-focused ion beam processing
Enhances the results from conventionally prepared specimens
Room temperature to cryogenically cooled NanoMilling SM process
Rapid specimen exchange for high- throughput applications
Computer-controlled, fully programmable, and easy to use
Contamination-free, dry vacuum system

Location

W205

Restriction

Booking via URFMS online booking system

Fee

Internal PolyU Users: $50/ hr
UGC-funded Tertiary Institutes: $75/ hr
Other External Users: $250/ hr

Other Information

Manufacturer: Fischione Instruments

Model: 1040 Nanomill

Category: Materials science

Owned by: University Research Facility in Materials Characterization and Device Fabrication

Contacts

Dr Lu Wei

University Research Facility in Materials Characterization and Device Fabrication

34002077
wei.lu@polyu.edu.hk

Related Equipment

Laboratory Package for Advanced Treatment on Fabric Surface in Experimental Teaching which consist of a 2-roll horizontal padder and a 2-roll vertical padder

Creep Testing System Kappa 50 SS-CF

domoMAT 4A XL

Nanoscribe Photonic Professional GT Two-Photon Laser Nano-Lithography System

Aduro 300 Platform

1 Analytical Platform for Material Flammability and Fire Emissions for Fire and Safety Engineering E

Analytical Platform for Material Flammability and Fire Emissions for Fire and Safety Engineering Education

Angstrom Nexdep Organic Deposition System

Atomic Force Microscope (AFM)-based Near-field Scanning Optical Microscope System

Cone Calorimeter

Femtosecond Laser