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Introduction:

Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

 

Applications:

  • Ultra-low-energy, inert-gas ion source
  • Concentrated ion beam with scanning capabilities
  • Removes damaged layers without redeposition
  • Ideal for post-focused ion beam processing
  • Enhances the results from conventionally prepared specimens
  • Room temperature to cryogenically cooled NanoMilling SM process
  • Rapid specimen exchange for high- throughput applications
  • Computer-controlled, fully programmable, and easy to use
  • Contamination-free, dry vacuum system

 

Notes to users:

Supplier information: 

         https://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill®-tem-specimen-preparation-system

 

 Please click here to download the equipment introduction poster.

 

Equipment location:

Room W205

 

 

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