Introduction:
The Precision Ion Polishing System (PIPS) is used for thinning and/ or polishing of plan-view, cross-sectional ceramic, or alloy samples for transmission electron microscopy (TEM) analysis. Since the ion polishing process is rather slow, it is important that the samples are pre-thinned less than 30 mm by e.g., mechanical grinding and polishing or chemical polishing. The instrument is equipped with two Penning ion guns (PIGs) using argon (Ar) ions for polishing. The voltage can be tuned between 100 V-8kV to prevent damage to the sample.
Applications:
- Precision ion polishing system for precise centering, control and reproducibility of your milling process.
- Compact, benchtop system designed to produce high-quality TEM specimens with exceptionally large, clean, electron-transparent areas.
- X, Y stage permits alignment of argon beams to region on the sample
- Improved collimated beam provides useable voltages as low as 100 volts for rapid and damage free preparation of FIB lamella
- 10” color touch screen for display and control of all PIPS II parameters
Notes to user:
Samples must be mechanically polished till less than 30 um before ion milling.
Supplier information:
https://www.gatan.com/products/tem-specimen-preparation/pips-ii-system
Please click here to download the equipment introduction poster.
Equipment location:
Room W205
