Introduction:
The Thermo Scientific Helios 5 CX DualBeam is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar electron column for ultra-high-resolution imaging and the highest materials contrast with the superior Thermo Scientific™ Tomahawk HT Focused Ion Beam (FIB) Column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios 5 CX DualBeam incorporates a suite of state of-the-art technologies that enables simple and consistent high-resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface, even on the most challenging samples.
Features / Applications:
- Highest-quality, site-specific, sample preparation for TEM and APT using the new high throughput Tomahawk HT Ion Column
- Fastest and easiest, fully automated, unattended, multisite in situ and ex situ TEM sample preparation and cross sectioning
- Shortest time to nanoscale information for users with any experience level using best-in-class Elstar Electron Column featuring SmartAlign and FLASH technologies
- The most complete sample information with sharp, refined and charge-free contrast obtained from up to six integrated in-column and below-the-lens detectors
- Fast, accurate and precise milling and deposition of complex structures with critical dimensions of less than 10 nm
- Easiest sample handling and navigation with high flexibility 110 mm stage, multi-purpose sample holder and Nav-Cam+
- Artifact-free imaging based on integrated sample cleanliness management and dedicated imaging modes
Notes to user:
Nonmagnetic Specimen surface must be even and without volatile matter.
Supplier information:
https://www.thermofisher.com/order/catalog/product/HELIOS5CX
Please click here to download the equipment introduction poster.
Equipment location:
Room W205
