Introduction:
The Spectra 300 (S)TEM is the highest resolution imaging and spectroscopic platform. By synchronizing new ultra-high resolution (X-FEG UltiMono source, Image and 5th order probe aberration correction, single electron sensitive STEM detection, wide-gap pole piece and sensitive energy dispersive X-ray (EDX) detectors through advanced software and automation modules, the Spectra 300 (S)TEM makes accessing the highest-resolution atomic-scale information more efficient, easy, and repeatable.
Applications:
- Best atomic characterization. Optimized electron optical performance and ultra-sensitive detection enables the best combination of atomic imaging and analysis in 2D and 3D.
- Most repeatable data. Sophisticated software automation routines such as OptiSTEM+ and OptiMono+ optimize the system to its peak performance, resulting in more repeatable and quantifiable data.
- Optimum EDS performance. Guaranteed by a portfolio of symmetric detector geometries, which contributes to unique quantification capability, in combination with an ultra-high brightness X-CFEG to provide rapid EDS mapping across the widest range of materials.
- Best in situ and dynamic research. Fast cameras, chemical detectors, smart software, and wide gap S-TWIN lens enable in situ data acquisition with no compromise on resolution and analytical capabilities.
- Best environmental stability. The redesigned enclosure and ultra-stable Spectra 300 (S)TEM base with passive and (optional) active vibration isolation minimize external environmental influences and ensure the highest quality data from long-term and short-term experiments.
- Widest range of materials science research in one platform. The best combination of optics, ultra-sensitive detection, and wide-gap pole piece, ensures that even the lightest, most sensitive materials can be characterized at the atomic scale.
Notes to users:
Inexperience users of the TEM are required to get training from the laboratory supervisor. Any first-time user of PolyU-AEML is required to be trained for microscopy skills.
Nonmagnetic specimens should ideally be less than 100nm in thickness, prepared carefully and plasma cleaned to minimize specimen contamination.
Usually accelerating voltage is 80kV during the last week of the month if user required.
Supplier information:
Please click here to download the equipment introduction poster.
Equipment location:
Room W205
