Introduction:
The VK-X200 is a laser scanning confocal microscope capable of ultra-fine, non-contact profile measurements. It combines the capabilities of an optical microscope, scanning electron microscope and roughness gauge into a single system. It provides non-contact profile, roughness and thickness measurements on nearly any material.
The laser scanning microscope employs two light sources: a laser source and a white light source. These two types of light sources enable the acquisition of laser intensity, color and height. The information can be used to construct fully-focused color images, fully-focused laser images and detailed height profile.
Specifications & Features:
- Laser light source: 408 nm violet laser
- Magnification on a 15” monitor: 200x - 3000x
- Optical zoom: 1x to 8x
- Laser scanning method: Area (2048 × 1536 pixels)
- Height measurement display resolution: down to < 5 nm
- Width measurement display resolution: down to < 10 nm
- Laser monochrome image:16-bit
- Color image: 8-bit for RGB each
- Robust measurement software: height, width, angle and cross-section measurement; Surface area and volume measurement; Line & surface roughness measurement.
- Auto function: AAG (Auto gain), Auto focus, Auto upper/lower limit setting, etc.
- Built-in easy mode
Notes to user:
Training is required prior to operation by user.
Supplier information:
https://www.keyence.com/keyence-tv/VK-X200_3D_Laser_Scanning_Microscope.jsp
Please click here to download the equipment introduction poster.
Equipment location:
Room BC720
