Introduction:
Integrated with the cutting-edge optical technologies so far, the Tescan CLARA FE-SEM serves as an ultrahigh resolution microscopic model for materials analysis at the nanoscale. This model now involves 4 detectors for imaging and 1 detector for energy dispersive X-ray (EDX) spectroscopy. Such a configuration not only allows for flexible selection of signal sources between secondary electrons (SE) and backscattered electrons (BSE), but it also enable analysts to observe their samples from diverse take off angles. Particularly, observations are now allowed to be further polished by applying a high-pass energy filter, which produces images from electrons above the user-defined energy levels.
Specifications:
1. Ultrahigh resolution imaging powered by the BrightBeam™ SEM column design;
2. A fully motorised sample stage where a maximum of 7 standard specimen stubs;
3. Detectors:
- An Everhart-Thormley (E-T) detector;
- A retractable BSE detector;
- An in-beam multidetector (MD);
- An in-beam Axial detector;
- A Bruker XFlash 7 EDX silicon drift detector.
4. Beam deceleration mode (BDM) gives enhanced resolution at low landing energies for flat specimen;
5. An EDX module for elemental analysis;
6. A sputter coater for sample preparation. Target material: platinum.
Notes to users:
- Only vacuum compatible solid samples are allowed;
- Users must be trained by the equipment-in-charge before they can use the instrument independently.
Booking:
Please contact Equipment-in-charge: Dr. Koopa LI for booking enquiry.
Contact information:
Location: Lab 610 inner, Building R2-A, The Hong Kong Polytechnic University Shenzhen Research Institute (PolyU SZRI)
Equipment-in-charge: Dr. Koopa LI (Office: SZRI 601)
E-mail: jiahua.li@polyu.edu.hk
Telephone: +86-755-26737196
