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<CAiRS Public Seminar> Challenges in Product Reliability & System Safety

  • 日期

    2022年11月3日

  • 主辦單位

    Centre for Advances in Reliability and Safety (CAiRS)

  • 時間

    15:00 - 17:00

  • 地點

    Inno2 Multi-function Room 2 – 3, 2/F, 17W, HKSTP  

備註

Language: English

摘要

The seminar was successfully held on 3 November 2022. Two world-renowned experts in Product Reliability & System Safety were invited to present and discuss the case studies in bare Printed Circuit Board (PCB) and Li-ion batteries.

Speakers
Prof. Kenneth K.M. LAM 
Professor and Associate Dean, Department of Electronic and Information Engineering of PolyU

Prof. Michael PECHT
Distinguished Professor and Director, Center for Life Cycle Engineering (CALCE) of University of Maryland

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Ir. Prof. Winco K.C. YUNG, Centre Director & Executive Director of CAiRS, delivered welcoming remarks for the Public Seminar Over 100 guests from the industries joined the seminar
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Prof. Kenneth LAM shared the topic of “Deep Feature Learning for Bare PCB Defect Detection” Prof. Michael PECHT shared the topic of “The Safety-related Challenges and Safety Strategies of Using Lithium-ion Batteries”
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Group photo of speakers Fruitful discussion during the Q&A session 

 

 

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