CAiRS Lecture: Reliability and Safety Analysis using Digital Twins
其他
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日期
2022年3月9日
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主辦單位
Centre for Advances in Reliability and Safety (CAiRS)
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時間
09:15 - 10:25
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地點
Online
講者
VARUN KHEMANI
MICHAEL H. AZARIAN
查詢
Ms Michelle Cheng +852 2162 5200 michelle.cheng@cairs.hk
備註
Open to public
摘要
A Digital Twin is an integrated multiphysics, multiscale, probabilistic simulation of an as-built system that uses the best available information, such as physical models, sensor data, and fleet history, to mirror the life of its real-world twin. It is inspired by the pairing technology used by NASA, where full-scale physical models of systems are used on the ground to mimic and diagnose problems in space-based systems. Digital twins can be produced for a system’s design, manufacturing/testing, and operation phases. Hence, they can be advantageous over the entire lifecycle. Specific advantages include fewer design cycles, shorter testing time, faster production time, and predicting maintenance issues before safety or reliability issues materialize.
This presentation will discuss digital twins for the operation phase of a system, which runs parallel to the real assets. It immediately flags as anomalous any operational behavior of the real asset that deviates from expected (simulated) behavior. Digital twins enable simulations of hundreds of future scenarios to see how different operational regimes and environmental/external factors affect asset performance. This approach helps in asset management and maintenance optimization through fault diagnosis and fault prognosis of the various faults of the asset to ensure its safety and reliability. In electronics and rotating machinery assets, analog circuits and gears/bearings are the major sources of faults, respectively. In this presentation, we will use them as examples to demonstrate the application of digital twins and the resulting benefits to safety and reliability.
講者
VARUN KHEMANI
Ph.D. Student, University of Maryland
VARUN KHEMANI received his B.E. degree in Instrumentation Engineering from the University of Mumbai and his M.S. in Industrial Engineering from North Carolina State University. He’s currently pursuing his Ph.D. in Reliability Engineering at the University of Maryland. He has work experience with Stanley, Black and Decker, Towson, MD, and Aker, Mumbai, India. His research interests include reliability and cybersecurity of electronic circuits and EDA Modeling and optimization of high dimensional circuits. He is a student member of IEEE, ASME, IEEE EDS, PHM Society, and ACES. He is certified as a Functional Safety Professional as per IEC 61511. He received the ASME Petroleum Division Scholarship in 2016.
MICHAEL H. AZARIAN
Research Scientist, Center for Advanced Life Cycle Engineering (CALCE), University of Maryland
MICHAEL H. AZARIAN is a Research Scientist at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland. He holds a Masters and Ph.D. in Materials Science and Engineering from Carnegie Mellon University and a Bachelors degree in Chemical Engineering from Princeton University. His research is focused on the analysis, detection, prediction, and prevention of failures in electronic and electromechanical products. He has over 150 publications on electronic packaging, component reliability, prognostics and health management, and tribology. He holds 6 U.S. patents. Prior to joining CALCE in 2004, he spent over 13 years in the data storage, advanced materials, and fiber optics industries. Dr. Azarian is chairman of the SAE G-19A standards committee on detection of counterfeit parts, which is responsible for the AS6171 and AS6810 family of standards. He is also chair of the standards committee for IEEE 1624 on organizational reliability capability.
