Introduction:
This XRD system is equipped with 9 kW rotating anode X-ray source (λ~1.54Å) coupling with high-quality semiconductor detector that supports 0D, 1D or 2D x-ray diffraction measurement. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane and out-of-plane diffraction measurement. Fully computer controlled alignment system allows users easily operate this x-ray diffraction system with different measurement mode. These high resolution XRD allows phase identification, crystallinity determination, structures and texture of materials study. Qualitative and semi-quantitative analysis of micro-structural features can be carried out. The system has numerous applications for wide range of materials including powders, thin films, bulk, and fluid samples.
Specifications / Applications:
- 9kW rotating anode X-ray source with scintillation counter and 1D high speed detector
- Automatic for conditions and optics setting, optimum, alignment and measurement
- Different measurement mode
- Bragg-Brentano focusing
- Qualitative and quantitative phase analysis
- Crystal structure analysis of powder
- Percent crystallinity analysis
- Crystallite size/lattice strain analysis
- Parallel beam
- Phase and structure analysis of thin film and powders
- Lattice parameter refinement
- Texture and stress analysis
- Film thickness, density and roughness analysis
- In-plane scan, grazing incidence scan, reciprocal space mapping and pole figure and x-ray reflectivity capabilities
Notes to user:
Supplier information:
https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/smartlab
Equipment location:
Room BC710
