Focused Ion Beam & Transmission Electron Microscope

Focused Ion Beam

Transmission Electron Microscope

Specifications

Major Functions / Key Features Location Restriction Fee Other Information

Major Functions / Key Features

JIB-4501

Ga Ion Beam Milling & Post Picking Up System
Electron Beam Lithography for Pattern Writing

JEOL-2010

Bright field image and Dark field image
Select area electron diffraction
High resolution electron microscopy
Energy dispersive X-ray spectroscopy
Low KV for organic and bio-materials

Location

CF002

Restriction

Booking via UMF online booking system

Fee

FIB:
Internal PolyU Users: $250/ hr
UGC-funded Tertiary Institutes: $375/ hr
Other External Users: $1,250/ hr

TEM:
Internal PolyU Users: $150/ hr
UGC-funded Tertiary institutes: $225/ hr
Other External Users: $750/ hr

Other Information

Manufacturer: JEOL

Model: JIB-4501, JEOL-2010

Category: Materials science

Owned by: University Research Facility in Materials Characterization and Device Fabrication

Contacts

Dr Wei Lu

University Research Facility in Materials Characterization and Device Fabrication

3400 2077
wei.lu@polyu.edu.hk

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Laboratory Package for Advanced Treatment on Fabric Surface in Experimental Teaching which consist of a 2-roll horizontal padder and a 2-roll vertical padder